AFM: Atomic Force Microscopy

The atomic force microscope (AFM) is a label-free surface technique and can provide the morphologica characterization of a sample with a sub-nanometre resolution. The capability to work in physiological-like conditions makes the AFM an important tool for the investigation of biological samples, from single molecules to cells, and tissue. The AFM is also an extremely sensitive force sensor and it can provide the mechanical characterization of the samples, detecting local changes that occur at the nanometre scale.

What are the sample requirements?

  • Samples for AFM must be very pure, preferably of crystallography grade.
  • Sample volume: About 100 uL.
  • Sample concentration: Bring a stock solution of 1 mg/ml.
  • The substrate of the sample should be standard microscope glass coverslip for AFM-STED and AFM-STORM and typically mica for other AFM applications.

What other specific considerations are relevant?

  • The sample volume and concentration given above should considered as a rough guideline.
  • Due to the wide diversity of possible samples, it is always good to discuss first the possibilities and limitations of the set-ups for a certain type of experiment and sample with the TNA site.

Partners offering this technique

MOSBRI reference partner site for this technique:

Other partners: